A recent study of the team of the Institute of structure of matter (Cnr-Ism), in collaboration with the University of Rome Tor Vergata and the Niccolò Cusano University and published on Nano-Micro Letters, show that self-powered X-ray detectors, based on FAPbBr3 255-nm-thick films deposited onto mesoporous TiO2 scaffolds, can withstand a 26-day X-ray exposure with no signal loss, demonstrating ultra-high operational stability. Sensitivity is evaluated to be 7.28 C Gy−1 cm−3, an unprecedented value for thin-film-based photoconductors and photodiodes for “hard” X-rays. Response of submicrometer-thick perovskite films to the X-rays produced by a medical linear accelerator used for cancer treatment is here demonstrated for the first time


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